EFFECT OF PERIODIC SURFACE-ROUGHNESS ON V(Z) CURVES FOR THE LINE-FOCUS ACOUSTIC MICROSCOPE

被引：7

作者：

LI, ZL

机构：

[1] Center for Quality Engineering and Failure Prevention, Northwestern University, Evanston

来源：

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL | 1993年 / 40卷 / 06期

关键词：

D O I：

10.1109/58.248211

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

A specimen with a periodic surface profile is considered to estimate the effect of surface roughness on the V(z) curve for the line-focus acoustic microscope. The Fourier optics approach is used to obtain the response of the lens and the Rayleigh-Fourier method is employed to obtain the reflection coefficients for plane wave incidence from the fluid side on the periodic surface. An integral expression is obtained to calculate V(z) curves for periodic surface profiles. The V(z) curves then are used to calculate the leaky Rayleigh wave velocities by applying the Fast Fourier Transform technique. Numerical results are presented to display the effect of sinusoidal surface roughness on the V(z) curves and the corresponding leaky Rayleigh wave velocities.

引用

页码：680 / 686

页数：7

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