REFLECTION X-RAY TOPOGRAPHY OF HARDNESS INDENTATIONS IN COPPER AND NICKEL SINGLE-CRYSTALS

被引：0
|
作者：
YOO, KC
ROESSLER, B
ARMSTRONG, RW
KURIYAMA, M
机构：
[1] BROWN UNIV,PROVIDENCE,RI 02912
[2] UNIV MARYLAND,COLLEGE PK,MD 20742
[3] NBS,WASHINGTON,DC 20234
来源：
JOURNAL OF METALS | 1980年 / 32卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：62 / 62
页数：1
相关论文
共 50 条
  • [1] REFLECTION X-RAY TOPOGRAPHY OF HARDNESS INDENTATIONS IN COPPER SINGLE-CRYSTALS
    YOO, KC
    ROESSLER, B
    ARMSTRONG, RW
    KURIYAMA, M
    SCRIPTA METALLURGICA, 1981, 15 (11): : 1245 - 1250
  • [2] DETERMINATION OF SUBGRAIN MISORIENTATION IN NICKEL SINGLE-CRYSTALS BY SURFACE REFLECTION X-RAY TOPOGRAPHY
    BOETTINGER, WJ
    KURIYAMA, M
    ARMSTRONG, RW
    JOURNAL OF METALS, 1980, 32 (08): : 28 - 28
  • [3] X-RAY TOPOGRAPHY OF LARGE SINGLE-CRYSTALS
    DINEEN, C
    JONES, FJ
    ISHERWOOD, BJ
    WALLACE, CA
    JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (MAR): : 383 - 388
  • [4] PREPARATION OF TITANIUM SINGLE-CRYSTALS FOR X-RAY TOPOGRAPHY
    JOURDAN, C
    GASTALDI, J
    ROMETALB.D
    PHILOSOPHICAL MAGAZINE, 1972, 26 (04): : 1053 - &
  • [5] X-RAY TOPOGRAPHY OF LARGE DIACETYLENE SINGLE-CRYSTALS
    ROSEMEIER, RG
    GREEN, RE
    BAUGHMAN, RH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 408 - 408
  • [6] SYNCHROTRON X-RAY SECTION TOPOGRAPHY FOR THICK SINGLE-CRYSTALS
    NAUKKARINEN, K
    BLOMBERG, M
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1983, 2 (03) : 111 - 114
  • [7] X-RAY SURFACE REFLECTION AND TRANSMISSION TOPOGRAPHY OF MAGNETIC DOMAIN-WALLS IN CZOCHRALSKI-GROWN NICKEL SINGLE-CRYSTALS
    KURIYAMA, M
    BOETTINGER, WJ
    BURDETTE, HE
    JOURNAL OF MATERIALS SCIENCE, 1977, 12 (02) : 353 - 357
  • [8] OBSERVATIONS OF OBLIQUE MAGNETIC DOMAIN-WALLS IN NICKEL SINGLE-CRYSTALS BY X-RAY TOPOGRAPHY
    BOETTINGER, WJ
    BURDETTE, HE
    KURIYAMA, M
    PHILOSOPHICAL MAGAZINE, 1977, 36 (04): : 763 - 776
  • [9] BERG-BARRETT X-RAY TOPOGRAPHY OF NICKEL SINGLE-CRYSTALS ELECTROLYTICALLY SATURATED WITH HYDROGEN
    PIELASZEK, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : K95 - &
  • [10] X-RAY REFLECTION PROPERTIES OF ANNEALED SILICON SINGLE-CRYSTALS
    ZAUMSEIL, P
    WINTER, U
    JOKSCH, S
    FREUND, AK
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01): : 907 - 910
12345