MICRODISCHARGES OF AC-COUPLED SILICON STRIP SENSORS

Microdischarge at the edges of strips in AC-coupled silicon strip sensors has been investigated. A steep increase in the leakage current (breakdown) and a sudden onset of burst noise were observed at a low reverse-bias voltage when the bias potential was across the AC-coupling capacitor. This can be explained by the occurrence of microdischarges along the edges of strips. These discharges have been confirmed by observing IR light emission. A calculation of the field strength at the strip edge suggests that a fringe field of the external electrode generates the microdischarge at the strip edge when the bias voltage is 50-80 V. This is consistent with our observations. We discuss a design for AC-coupled sensors that eliminates this discharge problem.