FIELD-ION MICROSCOPY IN COLOR USING MULTIPLE IMAGING GASES

被引：2
作者：
SCHUBERT, CC
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1972年 / 95卷 / JUN期
关键词：
D O I：
10.1111/j.1365-2818.1972.tb01050.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：467 / &
相关论文
共 50 条
  • [41] FIELD-ION MICROSCOPY OF TITANIUM CARBIDE
    SMITH, DA
    RALPH, B
    WILLIAMS, WS
    PHILOSOPHICAL MAGAZINE, 1967, 16 (140): : 415 - &
  • [42] FIELD-ION MICROSCOPY OF SEMICONDUCTOR COMPOUNDS WITH IMAGING GAS-MIXTURES
    ZVERKOV, VV
    STEPANOVA, AN
    OBOLENSKAYA, LN
    GIVARGIZOV, EI
    SURFACE SCIENCE, 1988, 200 (2-3) : 540 - 545
  • [43] ZONE PLATES AND FIELD-ION MICROSCOPY
    SOUTHWORTH, HN
    LEIFER, I
    WALLS, JM
    APPLIED PHYSICS LETTERS, 1973, 23 (03) : 161 - 163
  • [44] STUDY OF INTERFACES BY FIELD-ION MICROSCOPY
    SMITH, DA
    PHILOSOPHICAL MAGAZINE, 1973, 27 (05): : 1169 - 1173
  • [45] APPLICATION OF FIELD-ION MICROSCOPY TO TRIBOLOGY
    OHMAE, N
    JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1983, 28 (10): : 715 - 720
  • [46] FIELD-ION MICROSCOPY OF TEMPERED MARTENSITE
    RANGANATHAN, BN
    GRENGA, HE
    PHILOSOPHICAL MAGAZINE, 1974, 30 (01) : 161 - 169
  • [47] FIELD-ION MICROSCOPY VERSUS ELECTRON-MICROSCOPY
    BRONSVELD, PM
    ULTRAMICROSCOPY, 1979, 4 (01) : 115 - 116
  • [48] A FIELD-ION MICROSCOPY STUDY OF ION DAMAGE TO TUNGSTEN
    FARNUM, DJ
    INAL, OT
    WALKO, RJ
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1983, 80 (01): : 287 - 303
  • [49] PROGRESS IN FIELD-ION MICROSCOPY IMAGING OF HIGH-TC SUPERCONDUCTING OXIDES
    MELMED, AJ
    SHULL, RD
    CHIANG, CK
    JOURNAL DE PHYSIQUE, 1988, 49 (C-6): : 459 - 464
  • [50] ATOM-PROBE FIELD-ION MICROSCOPY
    LEISCH, M
    MIKROCHIMICA ACTA, 1992, 107 (3-6) : 95 - 104
12345