INFRARED AND RAMAN-SPECTROSCOPIC STUDY OF ULTRATHIN COPPER PHTHALOCYANINE FILMS VAPOR-DEPOSITED ON OXIDIZED ALUMINA

被引：33

作者：

DOWDY, J ^{[1
]}

HOAGLAND, JJ ^{[1
]}

HIPPS, KW ^{[1
]}

机构：

[1] WASHINGTON STATE UNIV,DEPT CHEM & CHEM PHYS,PULLMAN,WA 99164

来源：

JOURNAL OF PHYSICAL CHEMISTRY | 1991年 / 95卷 / 09期

关键词：

D O I：

10.1021/j100162a058

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Films of copper phthalocyanine (CuPc) deposited on air-oxidized aluminum are studied. Raman spectra are reported for films of thickness range 1-200 nm. Infrared reflectance-absorption spectroscopy is used to probe films 5-200 nm in thickness. While these films appear to exist in the alpha phase throughout this coverage interval, the thinner films are preferentially oriented with the unique molecular axis near the plane of the substrate. Thicker films, of the order of 200 nm, have a greater preponderance of crystallites oriented with the molecular axis pointing away from the surface.

引用

页码：3751 / 3755

页数：5

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