THE OPTICAL NEAR-FIELD AND ANALYTICAL-CHEMISTRY

被引:29
作者
LEWIS, A
LIEBERMAN, K
机构
[1] Division of Applied Physics, Hebrew University of Jerusalem, Jerusalem
关键词
D O I
10.1021/ac00011a002
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
[No abstract available]
引用
收藏
页码:A625 / &
相关论文
共 37 条
[1]   SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].
ASH, EA ;
NICHOLLS, G .
NATURE, 1972, 237 (5357) :510-&
[2]   BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].
BETZIG, E ;
TRAUTMAN, JK ;
HARRIS, TD ;
WEINER, JS ;
KOSTELAK, RL .
SCIENCE, 1991, 251 (5000) :1468-1470
[3]   NEAR-FIELD DIFFRACTION BY A SLIT - IMPLICATIONS FOR SUPERRESOLUTION MICROSCOPY [J].
BETZIG, E ;
HAROOTUNIAN, A ;
LEWIS, A ;
ISAACSON, M .
APPLIED OPTICS, 1986, 25 (12) :1890-1900
[4]  
BETZIG E, 1987, APPL PHYS LETT, V51, P2541
[5]  
BINNING G, 1986, PHYS REV LETT, V56, P934
[6]  
BROWN KT, 1986, IBRO HDB SERIES
[7]   SCANNING TUNNELING OPTICAL MICROSCOPY [J].
COURJON, D ;
SARAYEDDINE, K ;
SPAJER, M .
OPTICS COMMUNICATIONS, 1989, 71 (1-2) :23-28
[8]  
DEFORNEL F, 1989, SPIE, V1139, P77
[9]   NEAR-FIELD OPTICAL-SCANNING MICROSCOPY WITH TUNNEL-DISTANCE REGULATION [J].
DURIG, U ;
POHL, D ;
ROHNER, F .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :478-483
[10]   OPTICAL CHARACTERISTICS OF 0.1-MU-M CIRCULAR APERTURES IN A METAL-FILM AS LIGHT-SOURCES FOR SCANNING ULTRAMICROSCOPY [J].
FISCHER, UC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01) :386-390