RESOLUTION ENHANCEMENT BY OBLIQUE ILLUMINATION OPTICAL LITHOGRAPHY USING A TRANSMITTANCE-ADJUSTED PUPIL FILTER

被引:2
|
作者
HORIUCHI, T
HARADA, K
MATSUO, S
TAKEUCHI, Y
TAMECHIKA, E
MIMURA, Y
机构
[1] NTT LSI Laboratories, Atsugi Kanagawa, 243-01
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1995年 / 34卷 / 03期
关键词
OBLIQUE ILLUMINATION; PUPIL FILTER; OPTICAL LITHOGRAPHY; SUPER RESOLUTION; OPTICAL STEPPER; PROJECTION LENS; SSBL;
D O I
10.1143/JJAP.34.1698
中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper describes the resolution enhancement by oblique illumination optical lithography using a transmittance-adjusted pupil Biter that has a conjugate shape to the secondary light source. The resolution enhancement depends on the amplitude transmittance distribution of the pupil filter in the lens aperture. Thus, the optimum transmittance distribution attaining the highest resolution at a practical depth of focus is investigated, and superior performance is verified experimentally using an actual i-line stepper, that is, the actual resolution improvement is comparable to the simulation results. Despite this improvement, two problems must be addressed.,Pattern profiles degrade at the ends of periodical patterns, and the opaque pattern widths of middle-pitch patterns become a little narrow. These two problems are solved by optimizing the transmittance distribution of the filter such that there is no significant deterioration in the high-resolution performance.
引用
收藏
页码:1698 / 1708
页数:11
相关论文
共 42 条
  • [31] Super-Resolution and Optical Phase Retrieval Using Ptychographic Structured Illumination Microscopy
    Usuki, Shin
    Kuwae, Keichi
    Sekine, Tadatoshi
    Miura, Kenjiro T.
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2024, 25 (09) : 1813 - 1821
  • [32] Multiple image reconstruction for high-resolution optical imaging using structured illumination
    Usuki, S.
    Kudo, R.
    Takahashi, S.
    Takamasu, K.
    IMAGE RECONSTRUCTION FROM INCOMPLETE DATA VI, 2010, 7800
  • [33] Theoretical assessment of optical resolution enhancement and background fluorescence reduction by three-dimensional nonlinear structured illumination microscopy using stimulated emission depletion
    Dake, Fumihiro
    OPTICAL REVIEW, 2016, 23 (04) : 587 - 595
  • [34] Theoretical assessment of optical resolution enhancement and background fluorescence reduction by three-dimensional nonlinear structured illumination microscopy using stimulated emission depletion
    Fumihiro Dake
    Optical Review, 2016, 23 : 587 - 595
  • [35] Evaluating the performance of DP and EUVL by using analytical equations for resolution of optical lithography with considering required DOF
    Shibuya, Masato
    Nogami, Kouhei
    Takada, Akira
    Nakadate, Suezou
    OPTICAL MICROLITHOGRAPHY XXIV, 2011, 7973
  • [36] Development of super-resolution optical inspection system for semiconductor defects using standing wave illumination shift
    Usuki, S.
    Nishioka, H.
    Takahashi, S.
    Takamasu, K.
    OPTOMECHATRONIC SENSORS, INSTRUMENTATION, AND COMPUTER-VISION SYSTEMS, 2006, 6375
  • [37] Experimental verification of super-resolution optical inspection for semiconductor defect by using standing wave illumination shift
    Usuki, S.
    Nishioka, H.
    Takahashi, S.
    Takamasu, K.
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2010, 46 (9-12) : 863 - 875
  • [38] Experimental verification of super-resolution optical inspection for semiconductor defect by using standing wave illumination shift
    S. Usuki
    H. Nishioka
    S. Takahashi
    K. Takamasu
    The International Journal of Advanced Manufacturing Technology, 2010, 46 : 863 - 875
  • [39] Full-optical photoacoustic imaging using speckle analysis and resolution enhancement by orthogonal pump patterns projection
    Vorobev, Viktor
    Weidmann, David
    Agdarov, Sergey
    Beiderman, Yafim
    Shabairou, Nadav
    Benyamin, Matan
    Klampfl, Florian
    Schmidt, Michael
    Gorin, Dmitry
    Zalevsky, Zeev
    SCIENTIFIC REPORTS, 2023, 13 (01)
  • [40] FUNDAMENTAL VERIFICATION FOR 2-DIMENSIONAL SUPER-RESOLUTION OPTICAL INSPECTION FOR SEMICONDUCTOR DEFECTS BY USING STANDING WAVE ILLUMINATION SHIFT
    Kudo, R.
    Usuki, S.
    Takahashi, S.
    Takamasu, K.
    XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS, 2009, : 106 - 111