X-RAY-ABSORPTION FINE-STRUCTURE OF SELECTED R2FE17 NITRIDES

被引：7

作者：

CAEPHART, TW

MISHRA, RK

PINKERTON, FE

机构：

[1] Physics Department, General Motors Research and Development Center, Warren, MI 48090-9055

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 75卷 / 10期

关键词：

D O I：

10.1063/1.356762

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray-absorption fine structure from the rare-earth L3 edges in R2Fe17N3-x (R=Sm, Pr, or Nd), x-0.2, establishes that these nitrides have 2.6 +/- 0.6 nitrogen atoms bonded 2.54-2.57 angstrom from the rare-earth site. The observed enhancement of the nitrogen backscattering from magnetically oriented powders of SM2Fe17N3-x establishes that between 80% and 100% of the nitrogen atoms occupy 9(e) sites of the SM2Fe17N3-x. No evidence is found for partial nitrogen occupancy of the 18(g) sites in Sm2Fe17N3-x.

引用

收藏

页码：7018 / 7020

页数：3

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