X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES

被引:4
作者
FINDEISEN, E [1 ]
BRUGEMANN, L [1 ]
STETTNER, J [1 ]
TOLAN, M [1 ]
机构
[1] CHRISTIAN ALBRECHTS UNIV KIEL,INST EXPTL PHYS,D-24098 KIEL,GERMANY
关键词
D O I
10.1088/0953-8984/5/44/008
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The intensity of Bragg reflections depends strongly on the angle of incidence, if a highly collimated beam of x-rays is impinging at grazing incidence on a thin (200-600 Angstrom) polycrystalline antimony layer. In the case of asymmetric grazing incidence diffraction (AGID) the angle of incidence is small, as the exit angle must be large and nearly twice the Bragg angle. The experimental data are analysed on the basis of the distorted wave born approximation (DWBA), which yields the thickness d and the optical constants delta and beta of the layer. These parameters are compared with those determined from total external reflection data.
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收藏
页码:8149 / 8158
页数:10
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