CHARGE NEUTRALIZATION OF INSULATING SURFACES IN THE SEM BY GAS IONIZATION

被引：88

作者：

MONCRIEFF, DA ^{[1
]}

ROBINSON, VNE ^{[1
]}

HARRIS, LB ^{[1
]}

机构：

[1] UNIV NEW S WALES,FAC APPL SCI,KENSINGTON 2033,NEW S WALES,AUSTRALIA

来源：

关键词：

D O I：

10.1088/0022-3727/11/17/002

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2315 / 2325

页数：11

共 15 条

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[3] ENGEL AV, 1965, IONIZED GASES, pCH3
[4] HIGH-RESOLUTION EXAMINATION OF UNCOATED INSULATORS BY SEM APPLIED TO GRAIN-BOUNDARIES IN SODIUM-CHLORIDE
HARRIS, LB
MONCRIEFF, DA
ROBINSON, VNE
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 35 (01): : 371 - 377
[5] KOLLATH R, 1947, ANN PHYS-BERLIN, V1, P357
[6] MONCRIEFF DA, UNPUBLISHED
[7] DIRECT OBSERVATION OF INSULATORS WITH A SCANNING ELECTRON-MICROSCOPE
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PITAVAL, M
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11): : 1017 - 1020
[8] SECONDARY-ELECTRON EMISSION OF 10-100 KEV ELECTRONS FROM TRANSPARENT FILMS OF AL AND AU
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[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (05) : 805 - 815
[9] CONSTRUCTION AND USES OF AN EFFICIENT BACKSCATTERED ELECTRON DETECTOR FOR SCANNING ELECTRON-MICROSCOPY
ROBINSON, VN
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08): : 650 - 652
[10] REAPPRAISAL OF COMPLETE ELECTRON-EMISSION SPECTRUM IN SCANNING ELECTRON-MICROSCOPY
ROBINSON, VN
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (12) : L105 - &