OBSERVATION OF UNTINTED REPLICAS IN A LOW-VOLTAGE ELECTRON MICROSCOPE

被引:0
|
作者
SHCHETNEV, YF
机构
来源
INDUSTRIAL LABORATORY | 1969年 / 35卷 / 04期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:571 / +
页数:1
相关论文
共 50 条
  • [1] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE
    SAKITANI, Y
    TODOKORO, H
    FUKUHARA, S
    JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 229 - 229
  • [2] Contrast in the transmission mode of a low-voltage scanning electron microscope
    Golla, U.
    Schindler, B.
    Reimer, L.
    Journal of Microscopy, 1994, 173 (03) : 219 - 225
  • [3] NEW LENS FOR A LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE
    SHAO, ZE
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (09): : 1985 - 1989
  • [4] ELECTRON-SCATTERING IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE TARGETS
    MURATA, K
    KAWATA, H
    NAGAMI, K
    SCANNING MICROSCOPY, 1987, : 83 - 91
  • [5] OVERLAY MEASUREMENT USING THE LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE
    ROSENFIELD, MG
    STARIKOV, A
    MICROELECTRONIC ENGINEERING, 1992, 17 (1-4) : 439 - 444
  • [6] USE OF A LOW-VOLTAGE BULB FOR PRINTING ENLARGEMENTS OF ELECTRON MICROSCOPE PLATES
    KABE, H
    JOURNAL OF THE BIOLOGICAL PHOTOGRAPHIC ASSOCIATION, 1966, 34 (03): : 97 - &
  • [7] CHARGING EFFECTS IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE METROLOGY
    BRUNNER, M
    SCHMID, R
    SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 377 - 382
  • [8] CONTRAST IN THE TRANSMISSION MODE OF A LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE
    GOLLA, U
    SCHINDLER, B
    REIMER, L
    JOURNAL OF MICROSCOPY-OXFORD, 1994, 173 : 219 - 225
  • [9] CHARGING EFFECTS IN LOW-VOLTAGE SCANNING ELECTRON MICROSCOPE METROLOGY.
    Brunner, M.
    Schmid, R.
    Scanning Electron Microscopy, 1986, (pt 2): : 377 - 382
  • [10] LOW-VOLTAGE ELECTRON-BEAM LITHOGRAPHY WITH A SCANNING TUNNELING MICROSCOPE
    MARRIAN, CRK
    COLTON, RJ
    APPLIED PHYSICS LETTERS, 1990, 56 (08) : 755 - 757