A SIMPLE METHOD OF MEASURING VERY SMALL FRINGE SHIFTS

被引：13

作者：

SHAMIR, J

FOX, R

LIPSON, SG

机构：

[1] Physics Department, Technion-Israel Institute of Technology, Haifa

来源：

APPLIED OPTICS | 1969年 / 8卷 / 01期

关键词：

D O I：

10.1364/AO.8.000103

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In the method described, matched pairs of photoresistors are used for the measurement of fringe shifts. Its performance has been checked for sensitivity to light intensity and temperature fluctuations: under reasonable conditions, fringe shifts can be measured to an accuracy of 10-4 fringe. © 1969 Optical Society of America.

引用

页码：103 / &

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[J]. APPLIED OPTICS, 1967, 6 (01): : 137 - &
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