SOME COMMENTS ON LINE-BROADENING ANALYSES

被引：13

作者：

KIDRON, A ^{[1
]}

COHEN, JB ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,TECHNOL INST,DEPT MAT SCI,EVANSTON,IL 60201

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1973年 / 6卷 / FEB1期

关键词：

D O I：

10.1107/S0021889873007971

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：8 / 11

页数：4

共 11 条

[1]

DEANGELIS RJ, 1966, LOCAL ATOMIC ARRANGE, V36, P271

[2] SEPARATION OF ALPHA1-ALPHA2 DOUBLET IN X-RAY DIFFRACTION PROFILES [J].

GANGULEE, A .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 :272-&

[3] DIRECT EVALUATION OF KALPHA-1 FOURIER COEFFICENTS IN X-RAY PROFILE ANALYSIS [J].

KIDRON, A ;

DEANGELI.RJ .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (NOV1) :596-&

[4]

KIDRON A, 1971, S COMPUTER AIDED ENG, P285

[5]

KLUG HP, 1967, XRAY DIFFRACTION PRO, P498

[6] A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES [J].

RACHINGER, WA .

JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07) :254-255

[7] X-RAY STUDY OF FAULTING IN BCC METALS AND ALLOYS [J].

ROTHMAN, RL ;

COHEN, JB .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (03) :971-&

[8] SOME COMMENTS ON METHODOLOGY OF LINE-BROADENING ANALYSES [J].

ROTHMAN, RL ;

COHEN, JB .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :84-&

[9]

ROTHMAN RL, 1969, ADVAN XRAY ANAL, V12, P208

[10] A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].

STOKES, AR .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346) :382-391

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