LOW-PRESSURE HELIUM MICROWAVE-INDUCED PLASMA MASS-SPECTROMETRY FOR THE DETECTION OF HALOGENATED GAS-CHROMATOGRAPHIC EFFLUENTS

被引：41

作者：

CREED, JT ^{[1
]}

DAVIDSON, TM ^{[1
]}

SHEN, WL ^{[1
]}

CARUSO, JA ^{[1
]}

机构：

[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1990年 / 5卷 / 02期

关键词：

Chromatographic detection; Halogenated hydrocarbon detection; Low-pressure microwave-induced plasma mass spectrometry; Low-pressure plasma ion source;

D O I：

10.1039/ja9900500109

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A low-pressure helium microwave-induced plasma was interfaced to a mass spectrometer and the system was utilised as a detector for gas chromatography. The over-all system was optimised with respect to microwave power and the first-stage pressure of the mass spectrometer. The linear dynamic range for iodobenzene extended over three orders of magnitude starting at 1 pg. The absolute 3σ detection limit for iodine was 0.1 pg. The evaluation of the interface for the detection of bromine indicated an interference at mass 79 due to the formation of a polyatomic nickel species. A preliminary detection limit of 3.5 pg was calculated for bromine. A second interface design was used in a preliminary investigation of the backgrounds at masses 35 and 37. The background 35/37 ratio was correct, indicating a source of chlorine within the system. The detection limit for chlorine was 24 pg.

引用

页码：109 / 113

页数：5

共 15 条

[1] APPLICATION OF HELIUM MICROWAVE-INDUCED PLASMA MASS-SPECTROMETRY TO THE DETECTION OF HIGH IONIZATION-POTENTIAL GAS-PHASE SPECIES [J].