MEASUREMENT OF HALL COEFFICIENT OF SEMICONDUCTING FILMS BY VAN-DER-PAUW METHOD

被引：0
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作者：
POLYAKOV, NN
KONKOV, VL
机构：
来源：
INDUSTRIAL LABORATORY | 1969年 / 35卷 / 08期
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：1145 / &
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