ANALYSIS OF THE ANTITARNISH FILM ON A TIN SURFACE BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY

被引：0

作者：

WANG, ZW ^{[1
]}

WU, NJ ^{[1
]}

机构：

[1] NANJING UNIV,DEPT CHEM,NANJING 210008,PEOPLES R CHINA

来源：

ANALYTICA CHIMICA ACTA | 1990年 / 238卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：399 / 403

页数：5

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