METHOD OF DETERMINING TIP STRUCTURE IN ATOMIC FORCE MICROSCOPY

被引:17
|
作者
PAIK, SM
KIM, S
SCHULLER, IK
机构
[1] Physics Department, B-0319 University of California, San Diego, San Diego
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 07期
关键词
D O I
10.1103/PhysRevB.44.3272
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The stability of single atomic tip is tested using molecular-dynamics simulation. Many metallic single-atomic tips are unstable during the scan at a tip load well below typical experimental values. For the bcc W(111) tip, second-layer-tip-atomic contributions are comparable to the first-layer contribution. These results suggest that experimentally multiple-atom tips are involved in the scanning process. We propose a method to identify tip size and structure during the scanning process. The resultant images for a number of commonly used tip materials are interpreted and compared to experiments.
引用
收藏
页码:3272 / 3276
页数:5
相关论文
共 50 条
  • [31] Nonlinear dynamics for estimating the tip radius in atomic force microscopy
    Trinidad, E. Rull
    Gribnau, T. W.
    Belardinelli, P.
    Staufer, U.
    Alijani, F.
    APPLIED PHYSICS LETTERS, 2017, 111 (12)
  • [32] Studies of probe tip materials by atomic force microscopy: a review
    Xu, Ke
    Liu, Yuzhe
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2022, 13 : 1256 - 1267
  • [33] Tip penetration through lipid bilayers in atomic force microscopy
    Franz, V
    Loi, S
    Müller, H
    Bamberg, E
    Butt, HH
    COLLOIDS AND SURFACES B-BIOINTERFACES, 2002, 23 (2-3) : 191 - 200
  • [34] Ring of charge probed with Atomic Force Microscopy dielectric tip
    Eisenberg, Yishai
    Zypman, Fredy R.
    JOURNAL OF ELECTROSTATICS, 2019, 97 (95-100) : 95 - 100
  • [35] TORSIONAL TIP MOTION OF DOUBLE BEAM ATOMIC FORCE MICROSCOPY
    O'Donnell, John
    Zargarani, Anahita
    Mahmoodi, S. Nima
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, 2018, VOL 4, 2018,
  • [36] Quantification of atomic force microscopy tip and sample thermal contact
    Umatova, Zarina
    Zhang, Y.
    Rajkumar, Ravishkrishnan
    Dobson, Phillip S.
    Weaver, J. M. R.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (09):
  • [37] THEORY OF ELASTIC TIP SURFACE INTERACTIONS IN ATOMIC FORCE MICROSCOPY
    OVERNEY, G
    ZHONG, WQ
    TOMANEK, D
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 479 - 482
  • [38] Electrostatic forces acting on tip and cantilever in atomic force microscopy
    Bonaccurso, Elmar
    Schoenfeld, Friedhelm
    Butt, Hans-Juergen
    PHYSICAL REVIEW B, 2006, 74 (08)
  • [39] Effect of lateral tip motion on multifrequency atomic force microscopy
    Garrett, Joseph L.
    Krayer, Lisa J.
    Palm, Kevin J.
    Munday, Jeremy N.
    APPLIED PHYSICS LETTERS, 2017, 111 (04)
  • [40] Hydrodynamic damping of tip oscillation in pulsed-force atomic force microscopy
    Chen, X.
    Davies, M.C.
    Roberts, C.J.
    Tendler, S.J.B.
    Williams, P.M.
    2000, American Institute of Physics Inc. (77)