STEP-STRESS ACCELERATED LIFE TESTING OF DIODES

被引：4
|
作者：
BORA, JS
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1979年 / 19卷 / 03期
关键词：
D O I：
10.1016/0026-2714(79)90349-4
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：279 / 280
页数：2
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