STEP-STRESS ACCELERATED LIFE TESTING OF DIODES

被引：4

|

作者：

BORA, JS

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1979年 / 19卷 / 03期

关键词：

D O I：

10.1016/0026-2714(79)90349-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：279 / 280

页数：2

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