HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MODULATED STRUCTURE IN 20-K SUPERCONDUCTING OXIDE BI2SR2CUOY

被引：62
作者：
MATSUI, Y [1 ]
TAKEKAWA, S [1 ]
HORIUCHI, S [1 ]
UMEZONO, A [1 ]
机构：
[1] TOKAI CARBON CO LTD, FUJI RES LAB, OYAMA, SHIZUOKA 41014, JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1988年 / 27卷 / 10期
关键词：
D O I：
10.1143/JJAP.27.L1873
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：L1873 / L1876
页数：4
相关论文
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