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- [1] A DETERMINATION METHOD FOR TRANSGAUSSIAN TRAJECTORIES OF A MAGNETIC LENS WITH SYMMETRICAL REVOLUTIONCOMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1969, 268 (03): : 219 - &DELHOMME, MVAUTHIER, R
- [2] INVESTIGATION OF FIELD DISTRIBUTION IN SYMMETRICAL ELECTRON LENSJOURNAL OF APPLIED PHYSICS, 1951, 22 (10) : 1236 - 1241SHAH, JRJACOB, L
- [3] OPTICAL-PROPERTIES OF A SYMMETRICAL SLIT ELECTRON LENSJOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (04): : 444 - 447YOKOTA, HNAGAMI, K
- [4] THE SYMMETRICAL MAGNETIC ELECTRON MICROSCOPE OBJECTIVE LENS WITH LOWEST SPHERICAL ABERRATIONPROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (383): : 972 - 977LIEBMANN, G
- [5] ON ELECTRON DENSITY DISTRIBUTION IN AN IMAGE PLANE OF AN AXIALLY-SYMMETRICAL LENS SYSTEMJAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (11) : 1359 - &UCHIKAWA, YMARUSE, S
- [6] Computer simulation of electron trajectories with the space charge in cascade static lens gaugeAPPLIED SURFACE SCIENCE, 2001, 169 : 747 - 751Mitsui, TUrano, TTanaka, MKanaji, T
- [7] ASTIGMATIC ELECTRON-OPTICAL SYSTEMS FROM AN AXIALLY-SYMMETRICAL AND QUADRUPOLE LENSZHURNAL TEKHNICHESKOI FIZIKI, 1973, 43 (01): : 219 - 222GORELIK, SL
- [8] CALCULATION OF FIELDS AND SECONDARY-ELECTRON TRAJECTORIES IN A NEW IN-LENS SPECTROMETER FOR ELECTRON-BEAM TESTINGSIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1987, 16 (01): : 30 - 36PLIES, ESCHWEIZER, M
- [9] BERTRAM REVISITED - AN ANALYTIC APPROXIMATION TO THE PARAXIAL FIELD IN AXIALLY-SYMMETRICAL ELECTRON LENS SYSTEMSNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 332 (03): : 363 - 367BYRNE, JDAWBER, PG
- [10] AN ALGEBRAIC APPROACH TO THE SYMMETRICAL EINZEL LENSOPTIK, 1991, 88 (03): : 118 - 125CREWE, AV