共 50 条
- [21] Structural characterization of ZnTe films by X-ray diffraction technique INDIAN JOURNAL OF PHYSICS AND PROCEEDINGS OF THE INDIAN ASSOCIATION FOR THE CULTIVATION OF SCIENCE-PART A, 2003, 77A (05): : 487 - 490
- [24] CHARACTERIZATION OF SPUTTER DEPOSITED TUNGSTEN FILMS FOR X-RAY MULTILAYERS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (02): : 273 - 280
- [25] X-RAY CHARACTERIZATION OF THE ANISOTROPY PROPERTIES OF THIN-FILMS LETTERE AL NUOVO CIMENTO, 1979, 24 (02): : 33 - 38
- [26] Systematic characterization of new EBT4 radiochromic films in clinical x-ray beams BIOMEDICAL PHYSICS & ENGINEERING EXPRESS, 2025, 11 (01):