ADHESION FORCE MEASUREMENTS USING AN ATOMIC-FORCE MICROSCOPE UPGRADED WITH A LINEAR POSITION-SENSITIVE DETECTOR

The atomic force microscope (AFM), in addition to providing images on an atomic scale, can be used to measure the forces between surfaces and the AFM probe. The potential uses of mapping the adhesive forces on the surface include a spatial determination of surface energy and a direct identification of surface proteins through specific protein-ligand binding interactions. The capabilities of the AFM to measure adhesive forces can be extended by replacing the four-quadrant photodiode detection sensor with an external linear position sensitive detector and by utilizing a dedicated user-programmable signal generator and acquisition system. Such an upgrade enables the microscope to measure in the larger dynamic range of adhesion forces, improves the sensitivity and linearity of the measurement, and eliminates the problems inherent to the multiple repetitious contacts between the AFM probe and the specimen surface.