RAMAN-SCATTERING MEASUREMENTS OF SILICATE-GLASSES CONTAINING SULFATE

被引：23

作者：

KONIJNENDIJK, WL ^{[1
]}

BUSTER, JHJM ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

关键词：

D O I：

10.1016/0022-3093(77)90123-5

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：401 / 418

页数：18

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[7]

GEISSLER K, 1958, Z ANORG ALLG CHEM, V297, P180

[8]

Gmelin L., 1960, HDB ANORGANISCHEN CH

[9]

KENWORTHY R, 1973, SILIC IND, V38, P245

[10] RAMAN-SCATTERING MEASUREMENTS OF SILICATE-GLASSES AND COMPOUNDS [J].

KONIJNENDIJK, WL ;

STEVELS, JM .