RAPID X-RAY METHOD FOR DETERMINATION OF SUBSTRUCTURE CHARACTERISTICS

被引：5
作者：
WEISSMANN, S
GORMAN, LA
ZWELL, L
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1962年 / 33卷 / 10期
关键词：
D O I：
10.1063/1.1728580
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：3131 / &
相关论文
共 9 条
[1]  
BARRETT CS, 1945, T AM I MIN MET ENG, V161, P15
[2]   Roentgenographic methods for investigating lattice imperfections in crystals [J].
Berg, W .
NATURWISSENSCHAFTEN, 1931, 19 :391-396
[3]  
Berg WF, 1934, Z KRISTALLOGR, V89, P286
[4]  
HIRSCH PB, 1956, PROGR METAL PHYSICS, V6, P282
[5]   AN X-RAY DIFFRACTION METHOD FOR THE STUDY OF SUBSTRUCTURE OF CRYSTALS [J].
INTRATER, J ;
WEISSMANN, S .
ACTA CRYSTALLOGRAPHICA, 1954, 7 (11) :729-&
[6]  
NAKAYAMA Y, 1962, 1961 P AM I MIN MET, P573
[7]  
SCHULZ LG, 1954, T AM I MIN MET ENG, V200, P1082
[8]   METHOD FOR THE STUDY OF LATTICE INHOMOGENEITIES COMBINING X-RAY MICROSCOPY AND DIFFRACTION ANALYSIS [J].
WEISSMANN, S .
JOURNAL OF APPLIED PHYSICS, 1956, 27 (04) :389-395
[9]  
WEISSMANN S, 1960, T AM SOC MET, V52, P599
1