ANOMALOUS LOW-FREQUENCY NOISE IN MOS-TRANSISTORS AT LOW-TEMPERATURES

被引:0
|
作者
NAKAHARA, M [1 ]
机构
[1] FUJITSU LTD,KOBE,KOBE 652,JAPAN
来源
ELECTRONICS & COMMUNICATIONS IN JAPAN | 1972年 / 55卷 / 06期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:99 / 105
页数:7
相关论文
共 50 条
  • [1] MOS-TRANSISTORS - NOISE PERFORMANCE AT LOW-TEMPERATURES
    CARRUTHERS, C
    MAVOR, J
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C429 - C429
  • [2] LOW-FREQUENCY NOISE IN MOS-TRANSISTORS
    GENTIL, P
    ONDE ELECTRIQUE, 1978, 58 (8-9): : 565 - 575
  • [3] LOW-FREQUENCY NOISE IN MOS-TRANSISTORS .2.
    GENTIL, P
    ONDE ELECTRIQUE, 1978, 58 (10): : 645 - 652
  • [4] LOW-FREQUENCY NOISE IN DEPLETION-MODE SIMOX MOS-TRANSISTORS
    ELEWA, T
    BOUKRISS, B
    HADDARA, HS
    CHOVET, A
    CRISTOLOVEANU, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (02) : 323 - 327
  • [5] IMPACT OF SCALING DOWN ON LOW-FREQUENCY NOISE IN SILICON MOS-TRANSISTORS
    GHIBAUDO, G
    ROUXDITBUISSON, O
    BRINI, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 132 (02): : 501 - 507
  • [6] LOW-FREQUENCY NOISE MEASUREMENTS ON SILICON-ON-SAPPHIRE (SOS) MOS-TRANSISTORS
    GENTIL, P
    CHAUSSE, S
    SOLID-STATE ELECTRONICS, 1977, 20 (11) : 935 - 940
  • [7] IMPROVED ANALYSIS OF LOW-FREQUENCY NOISE IN FIELD-EFFECT MOS-TRANSISTORS
    GHIBAUDO, G
    ROUX, O
    NGUYENDUC, C
    BALESTRA, F
    BRINI, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 124 (02): : 571 - 581
  • [8] TEMPERATURE-DEPENDENCE OF LOW-FREQUENCY NOISE IN N-CHANNEL MOS-TRANSISTORS
    WONG, H
    CHENG, YC
    APPLIED SURFACE SCIENCE, 1989, 39 (1-4) : 493 - 499
  • [9] EFFECTS OF OXYGEN-REDUCTION TREATMENTS ON THRESHOLD VOLTAGE AND LOW-FREQUENCY NOISE OF MOS-TRANSISTORS
    HIELSCHER, FH
    END, JH
    APPLIED PHYSICS LETTERS, 1974, 24 (01) : 27 - 29
  • [10] INFLUENCE OF SUBSTRATE FREEZE-OUT ON THE CHARACTERISTICS OF MOS-TRANSISTORS AT VERY LOW-TEMPERATURES
    BALESTRA, F
    AUDAIRE, L
    LUCAS, C
    SOLID-STATE ELECTRONICS, 1987, 30 (03) : 321 - 327