A SYNTHETIC TEST METHOD FOR EVALUATING THE SHUNT CAPACITOR SWITCHING PERFORMANCE OF VACUUM CIRCUIT-BREAKERS

被引：10

作者：

OHSHIGA, I

YOKOKURA, K

MATSUDA, M

KANAI, Y

SATO, K

YANABU, S

机构：

[1] Toshiba Corporation, Tokyo.

来源：

IEEE TRANSACTIONS ON POWER DELIVERY | 1990年 / 5卷 / 04期

关键词：

D O I：

10.1109/61.103681

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes a single phase synthetic test method for evaluating the shunt capacitor switching performance of circuit breakers. The most important factor for evaluating the performance of a shunt capacitor switch is restriking, which is mainly influenced by the inrush current and the recovery voltage. A synthetic test circuit comprised of a current source, a voltage source and the high frequency current source was designed to evaluate vacuum circuit breakers. Results show that this method is especially suitable for obtaining a restriking probability distribution. © 1990 IEEE

引用

页码：1846 / 1854

页数：9

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[6]

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YANABU, S ;

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[10]

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