HIGH-RESOLUTION SPUTTERING USING A FOCUSED ION-BEAM

被引:43
作者
KUBENA, RL
SELIGER, RL
STEVENS, EH
机构
关键词
D O I
10.1016/0040-6090(82)90199-7
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:165 / 169
页数:5
相关论文
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