ANODIC OXIDE FILMS ON NIOBIUM - THICKNESS, DIELECTRIC CONSTANT, DISPERSION, REFLECTION MINIMA, FORMATION FIELD STRENGTH, AND SURFACE AREA

被引：74

作者：

YOUNG, L

机构：

来源：

CANADIAN JOURNAL OF CHEMISTRY | 1960年 / 38卷 / 07期

关键词：

D O I：

10.1139/v60-159

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1141 / 1147

页数：7

共 14 条

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[8]

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[9] THE DETERMINATION OF THE THICKNESS, DIELECTRIC CONSTANT, AND OTHER PROPERTIES OF ANODIC OXIDE FILMS ON TANTALUM FROM THE INTERFERENCE COLOURS [J].

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PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1958, 244 (1236) :41-53

[10] ANODIC OXIDE FILMS .5. KINETICS OF FORMATION OF ANODIC OXIDE FILMS ON NIOBIUM SPACE CHARGE AND THE TAFEL SLOPE ANOMALY [J].

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