SCALABLE SMALL-SIGNAL MODEL FOR BJT SELF-HEATING

被引：13

作者：

FOX, RM

LEE, SG

机构：

[1] VLSI TCAD Group, Department of Electrical Engineering, University of Florida, Gainesville

来源：

IEEE ELECTRON DEVICE LETTERS | 1991年 / 12卷 / 12期

关键词：

D O I：

10.1109/55.116943

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effects of self-heating on BJT behavior are demonstrated through measurement and simulation. Most affected are the small-signal parameters Y22 and Y12. A frequency-domain solution to the heat-flow equation is presented that applies to any rectangular emitter geometry. This model, although simple enough for CAD, predicts thermal spreading impedance with good accuracy for a wide range of frequencies.

引用

页码：649 / 651

页数：3

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