INVESTIGATIONS OF LONG-TERM PROPAGATION MARGINS IN ION-IMPLANTED CONTIGUOUS-DISK BUBBLE-DEVICES

被引：4

作者：

DEUTSCH, A ^{[1
]}

KRYDER, MH ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,PITTSBURGH,PA 15213

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1980年 / 16卷 / 02期

关键词：

D O I：

10.1109/TMAG.1980.1060600

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：416 / 423

页数：8

共 12 条

[1] SPONTANEOUS ANNIHILATIONS IN MAGNETIC-BUBBLE PROPAGATION [J].

CALLEN, H ;

DOYLE, WD ;

SEITCHIK, J .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (11) :4970-4975

[2]

CHAKRAVARTI IM, HDB METHODS APPLIED, V1, P362

[3] EXPERIMENTAL-TECHNIQUES FOR STUDYING RELIABILITY OF BUBBLE MEMORY DEVICES [J].

CHEN, TT ;

TOCCI, LR ;

ARCHER, JL .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (01) :373-378

[4]

DEUTSCH A, UNPUBLISHED

[5] EFFECT OF DC IN PLANE FIELD ON OPERATION OF FIELD ACCESS BUBBLE MEMORY DEVICES [J].

GERGIS, IS ;

CHEN, TT ;

TOCCI, LR .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (01) :7-14

[6]

GNEDENKO B, 1962, ELEMENTARY INTRO THE, P32

[7] LONG-TERM TESTING OF 68 KBIT BUBBLE DEVICE CHIPS [J].

HAGEDORN, FB .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :680-682

[8] PROBABILITY OF INFORMATION LOSS AT EDGES OF BUBBLE PROPAGATION MARGINS [J].

LACEY, RF ;

WAITES, RF .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :674-676

[9]

LIN Y, UNPUBLISHED

[10] CHARGED WALL BEHAVIOR IN 1-MU-M BUBBLE IMPLANTED STRUCTURES [J].

LIN, YS ;

DOVE, DB ;

SCHWARZL, S ;

SHIR, CC .

IEEE TRANSACTIONS ON MAGNETICS, 1978, 14 (05) :494-499

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