INFLUENCE OF THE EMITTER SURFACE-ROUGHNESS ON THE FIELD ELECTRON-EMISSION

被引:0
|
作者
BONDARENKO, BV
MAKUKHA, VI
RYBAKOV, YL
SHAROV, VB
SHESHIN, EP
机构
来源
RADIOTEKHNIKA I ELEKTRONIKA | 1987年 / 32卷 / 12期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2606 / 2610
页数:5
相关论文
共 50 条
  • [31] INFLUENCE OF SURFACE-ROUGHNESS ON THE INFRARED RESTSTRAHLEN BAND
    ANDERSSON, SK
    NIKLASSON, GA
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1995, 7 (36) : 7173 - 7184
  • [32] Influence of surface-roughness on indentation size effect
    Kim, Ju-Young
    Kang, Seung-Kyun
    Lee, Jung-Jun
    Jang, Jae-il
    Lee, Yun-Hee
    Kwon, Dongil
    ACTA MATERIALIA, 2007, 55 (10) : 3555 - 3562
  • [33] EFFECT OF SURFACE-ROUGHNESS ON THE MICROWAVE EMISSION FROM SOILS
    CHOUDHURY, BJ
    SCHMUGGE, TJ
    CHANG, A
    NEWTON, RW
    JOURNAL OF GEOPHYSICAL RESEARCH-OCEANS, 1979, 84 (NC9) : 5699 - 5706
  • [34] INFLUENCE OF SURFACE-ROUGHNESS ON OPTICAL-SCANNING
    WARNECKE, HJ
    AHLERS, RJ
    KIM, HS
    WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1987, 77 (06): : 307 - 310
  • [35] TIP ASPECT DEPENDENCE IN ANGULAR CONFINEMENT OF ELECTRON-EMISSION FROM TI/W(001) FIELD EMITTER
    KURODA, K
    HOSOKI, S
    KOMODA, T
    JOURNAL OF ELECTRON MICROSCOPY, 1987, 36 (04): : 151 - 156
  • [36] Influence of surface roughness on secondary electron emission from graphite
    Burton, Thomas S.
    Back, Tyson C.
    Fairchild, Steven B.
    Thompson, Gregory B.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2017, 35 (04):
  • [37] EFFECT OF SURFACE-ROUGHNESS ON AUGER-ELECTRON SPECTROSCOPY
    HOLLOWAY, PH
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (03) : 215 - 232
  • [38] THE INFLUENCE OF SURFACE-ROUGHNESS ON THE POLARIZATION AFTER ELECTRON-CAPTURE BY BEAM FOIL INTERACTION
    KUPFER, E
    GABRIEL, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 208 - 212
  • [39] MOLECULAR VIEW OF SURFACE ELECTRON-EMISSION SPECTROSCOPIES
    PLUMMER, EW
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (07): : 969 - 969
  • [40] THE EFFECTS OF SURFACE-ROUGHNESS ON AUGER-ELECTRON SPECTROSCOPY
    WEHBI, D
    ROQUESCARMES, C
    JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 319 - 322