FABRICATION OF SPECIMENS BY ION-BEAM SPUTTERING FOR HIGH-RESOLUTION EM

被引：0
|
作者：
HOJOU, K
ADACHI, K
KIMURA, T
KANAYA, K
机构：
[1] KOGAKUIN UNIV,DEPT ELECTR ENGN,TOKYO,JAPAN
[2] UNIV TOKYO,INST ENG RES,TOKYO 113,JAPAN
[3] SNOW BRAND MILK PROD CO LTD,INST TECH RES,DIV RES,KAWAGOE,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1977年 / 26卷 / 03期
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：260 / 260
页数：1
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