X-RAY INTERFERENCE IN ULTRATHIN EPITAXIAL LAYERS - A VERSATILE METHOD FOR THE STRUCTURAL-ANALYSIS OF SINGLE QUANTUM WELLS AND HETEROINTERFACES

被引：153
作者：
TAPFER, L
PLOOG, K
机构：
来源：
PHYSICAL REVIEW B | 1989年 / 40卷 / 14期
关键词：
D O I：
10.1103/PhysRevB.40.9802
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：9802 / 9810
页数：9
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