共 21 条
[1]
A CORRELATION OF AUGER-ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON-SPECTROSCOPY, AND RUTHERFORD BACKSCATTERING SPECTROMETRY MEASUREMENTS ON SPUTTER-DEPOSITED TITANIUM NITRIDE THIN-FILMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1986, 4 (06)
:2463-2469
[6]
MORPHOLOGY AND PROPERTIES OF SPUTTERED HFN LAYERS AS A FUNCTION OF SUBSTRATE-TEMPERATURE AND SPUTTERING ATMOSPHERE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (06)
:2406-2410
[7]
MARTIN PJ, 1987, J VAC SCI TECHNOL A, V5
[10]
TI-N PHASES FORMED BY REACTIVE ION PLATING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (06)
:2419-2425