ON THE DEGRADATION OF CONDUCTING LANGMUIR-BLODGETT-FILMS

被引:0
|
作者
CARRARA, S [1 ]
GUSSONI, A [1 ]
EROKHIN, V [1 ]
NICOLINI, C [1 ]
机构
[1] TECHNOBIOCHIP,MARCIANA,ITALY
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Direct current through conducting Langmuir-Blodgett films was observed as a function of the applied voltage and alternating current as a function of frequency. In some cases voltage-current characteristics appeared to be quasi-ohmic but in other cases they exhibited tunneliing-like behaviour. This phenomenon was interpreted as being due to the progressive detachment of the film from the micro-electrodes, as confirmed by measurements of the conductivity as a function of time. This interpretation was also confirmed by estimating the tunnelling barrier parameters from voltage-current characteristics, by conductivity measurements before and after thermal treatment of the samples and by conductivity measurements of samples stored in air and under vacuum.
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页码:79 / 83
页数:5
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