SIZE AND STRAIN PARAMETERS FROM PEAK PROFILES - SENSE AND NONSENSE

[11] Hauk VM., 1983, ADV XRAY ANAL, V27, P81

[12] ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING USING A NON-IDEAL STANDARD SPECIMEN [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1978, 33 (03): : 316 - 320

[13] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd

[14] PROFILE ANALYSIS FOR MICROCRYSTALLINE PROPERTIES BY THE FOURIER AND OTHER METHODS [J]. AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (02): : 173 - 187

[15] ROTHMAN RL, 1969, ADVAN XRAY ANAL, V12, P208

[16] A METHOD FOR THE INTERPRETATION OF THE WARREN-AVERBACH MEAN-SQUARED STRAINS AND ITS APPLICATION TO RECOVERY IN ALUMINUM [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 176 - 182

[17] TURUNEN MJ, 1976, NUCLEAR METALLURGY 2, V20, P850

[18] WAGNER CNJ, 1966, LOCAL ATOMIC ARRANGE, P217

[19] Warren B.E., 1969, XRAY DIFFRACTION

[20] THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (06) : 595 - 599

[11] Hauk VM., 1983, ADV XRAY ANAL, V27, P81

[12] ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING USING A NON-IDEAL STANDARD SPECIMEN [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1978, 33 (03): : 316 - 320

[13] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd

[14] PROFILE ANALYSIS FOR MICROCRYSTALLINE PROPERTIES BY THE FOURIER AND OTHER METHODS [J]. AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (02): : 173 - 187

[15] ROTHMAN RL, 1969, ADVAN XRAY ANAL, V12, P208

[16] A METHOD FOR THE INTERPRETATION OF THE WARREN-AVERBACH MEAN-SQUARED STRAINS AND ITS APPLICATION TO RECOVERY IN ALUMINUM [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 176 - 182

[17] TURUNEN MJ, 1976, NUCLEAR METALLURGY 2, V20, P850

[18] WAGNER CNJ, 1966, LOCAL ATOMIC ARRANGE, P217

[19] Warren B.E., 1969, XRAY DIFFRACTION

[20] THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (06) : 595 - 599