SIZE AND STRAIN PARAMETERS FROM PEAK PROFILES - SENSE AND NONSENSE

被引：43

作者：

DELHEZ, R ^{[1
]}

DEKEIJSER, TH ^{[1
]}

MITTEMEIJER, EJ ^{[1
]}

LANGFORD, JI ^{[1
]}

机构：

[1] UNIV BIRMINGHAM, DEPT PHYS, BIRMINGHAM B15 2TT, W MIDLANDS, ENGLAND

来源：

AUSTRALIAN JOURNAL OF PHYSICS | 1988年 / 41卷 / 02期

关键词：

D O I：

10.1071/PH880213

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：213 / 227

页数：15

相关论文

共 24 条

[1] SIMPLIFICATIONS IN THE X-RAY LINE-SHAPE ANALYSIS
ADLER, T
HOUSKA, CR
[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) : 3282 - 3287
[2] RAIES DE DEBYE-SCHERRER ET REPARTITION DES DIMENSIONS DES DOMAINES DE BRAGG DANS LES POUDRES POLYCRISTALLINES
BERTAUT, EF
[J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (01): : 14 - 18
[3] BRAND PC, 1988, IN PRESS
[4] COHEN JB, 1980, NBS SPEC PUBL, V567, P453
[5] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING
DEKEIJSER, TH
LANGFORD, JI
MITTEMEIJER, EJ
VOGELS, ABP
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 308 - 314
[6] NOTES ON THE HANDLING OF POSITION AND BROADENING ERRORS IN DECONVOLUTED X-RAY-DIFFRACTION LINE-PROFILES
DEKEIJSER, TH
MITTEMEIJER, EJ
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (FEB): : 74 - 77
[7] TRUNCATION IN DIFFRACTION PATTERN-ANALYSIS .1. CONCEPT OF A DIFFRACTION LINE-PROFILE AND ITS RANGE
DELHEZ, R
DEKEIJSER, TH
MITTEMEIJER, EJ
LANGFORD, JI
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 459 - 466
[8] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS
DELHEZ, R
DEKEIJSER, TH
MITTEMEIJER, EJ
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01): : 1 - 16
[9] ELIMINATION OF AN APPROXIMATION IN WARREN-AVERBACH ANALYSIS
DELHEZ, R
MITTEMEIJER, EJ
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (JUN1) : 233 - 234
[10] DELHEZ R, 1980, NBS SPEC PUBL, V567, P213