TUNGSTEN CHEMICAL-VAPOR-DEPOSITION ON SILICON AND SILICON DIOXIDE WITH PLASMA EXCITED HYDROGEN

被引:4
作者
SAITO, Y
TAKAGI, T
机构
[1] Department of Electric Engineering and Electronics, Seikei University
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 7B期
关键词
TUNGSTEN FILMS; REMOTE PLASMA CHEMICAL VAPOR DEPOSITION; EXCITED HYDROGEN; NONSELECTIVE DEPOSITION; GROWTH RATE; RESISTIVITY; X-RAY DIFFRACTION;
D O I
10.1143/JJAP.33.4413
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nonselective chemical vapor deposition of tungsten films on silicon and silicon dioxide substrates by remote-plasma excited argon and hydrogen gaseous mixtures at substrate temperatures below 350 degrees C was achieved. The growth rate shows an almost linear,relationship with the hydrogen partial pressure above 0.6 Torr, but depends slightly on the argon partial pressure. The hydrogen partial pressure also influences the resistivity of the deposited films. The sufficient supply of the excited hydrogen improves growth rate and film properties.
引用
收藏
页码:4413 / 4416
页数:4
相关论文
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