A K-OUT-OF-N - G 3-STATE UNIT REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES AND REPLACEMENTS

被引：10
作者：
CHUNG, WK
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1981年 / 21卷 / 04期
关键词：
D O I：
10.1016/0026-2714(81)90253-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：589 / 591
页数：3
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