WEAK-BEAM CONTRAST OF STACKING-FAULTS IN TRANSMISSION ELECTRON-MICROSCOPY

被引：42
作者：
FOLL, H
CARTER, CB
WILKENS, M
机构：
[1] CORNELL UNIV,ITHACA,NY 14850
[2] MAX PLANCK INST MET RES,INST PHYS,D-7000 STUTTGART 1,FED REP GER
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 58卷 / 02期
关键词：
D O I：
10.1002/pssa.2210580210
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：393 / 407
页数：15
相关论文
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