A 14-NS 256KX1 CMOS SRAM WITH MULTIPLE TEST MODES

被引：4

作者：

VOSS, PH

PFENNINGS, LCMG

PHELAN, CG

OCONNELL, CM

DAVIES, TJ

ONTROP, H

BELL, SA

SALTERS, RHW

机构：

[1] Philips Research Lab, Eindhoven, Neth

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1989年 / 24卷 / 04期

关键词：

D O I：

10.1109/4.34064

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：874 / 880

页数：7

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