A METHOD OF DIRECT MEASUREMENT OF THE 2D PLASMA CONDUCTIVITY TENSOR COMPONENTS NEAR SEMICONDUCTOR SURFACES

被引：0
作者：
DOBROVOLSKII, VN
KROLEVETS, AN
机构：
来源：
SURFACE SCIENCE | 1982年 / 120卷 / 01期
关键词：
D O I：
10.1016/0039-6028(82)90266-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L409 / L411
页数：3
相关论文
共 50 条
  • [31] A Calibration Method for the Resolution of 2D TPP Laser Direct Writing
    Xie, Yu
    Chen, Yixiong
    Xu, Hang
    Chen, Jianxiong
    MICROMACHINES, 2023, 14 (01)
  • [32] Direct thermal neutron detection by the 2D semiconductor 6LiInP2Se6
    Daniel G. Chica
    Yihui He
    Kyle M. McCall
    Duck Young Chung
    Rahmi O. Pak
    Giancarlo Trimarchi
    Zhifu Liu
    Patrick M. De Lurgio
    Bruce W. Wessels
    Mercouri G. Kanatzidis
    Nature, 2020, 577 : 346 - 349
  • [33] The scalability of the matrices in direct Trefftz method in 2D Laplace problem
    Borkowski, M.
    ENGINEERING ANALYSIS WITH BOUNDARY ELEMENTS, 2016, 64 : 12 - 18
  • [34] 2D permeability tensor identification of fibrous reinforcements for RTM using an inverse method
    Morren, Gerd
    Bossuyt, Sven
    Sol, Hugo
    COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING, 2008, 39 (09) : 1530 - 1536
  • [35] Direct thermal neutron detection by the 2D semiconductor 6LiInP2Se6
    Chica, Daniel G.
    He, Yihui
    McCall, Kyle M.
    Chung, Duck Young
    Pak, Rahmi O.
    Trimarchi, Giancarlo
    Liu, Zhifu
    De Lurgio, Patrick M.
    Wessels, Bruce W.
    Kanatzidis, Mercouri G.
    NATURE, 2020, 577 (7790) : 346 - +
  • [36] On-chip microelectrode array and in situ transient calibration for measurement of transient concentration gradients near surfaces of 2D cell cultures
    Sridharan, Siddarth V.
    Rivera, Jose F.
    Nolan, James K.
    Alam, Muhammad A.
    Rickus, Jenna L.
    Janes, David B.
    SENSORS AND ACTUATORS B-CHEMICAL, 2018, 260 : 519 - 528
  • [37] A direct method for 3D factorization of nonrigid motion observed in 2D
    Brand, M
    2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Vol 2, Proceedings, 2005, : 122 - 128
  • [38] Direct Visualization of Subnanometer Variations in the Excitonic Spectra of 2D/3D Semiconductor/Metal Heterostructures
    Reidy, Kate
    Majchrzak, Paulina Ewa
    Haas, Benedikt
    Thomsen, Joachim Dahl
    Konecna, Andrea
    Park, Eugene
    Klein, Julian
    Jones, Alfred J. H.
    Volckaert, Klara
    Biswas, Deepnarayan
    Watson, Matthew D.
    Cacho, Cephise
    Narang, Prineha
    Koch, Christoph T.
    Ulstrup, Soren
    Ross, Frances M.
    Idrobo, Juan Carlos
    NANO LETTERS, 2023, 23 (03) : 1068 - 1076
  • [39] Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers
    Swertfeger, Rebecca B.
    Beil, James A.
    Misak, Stephen M.
    Thomas, Jeremy
    Campbell, Jenna
    Renner, Daniel
    Mashanovitch, Milan
    Leisher, Paul O.
    PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PHOTONICS, OPTICS AND LASER TECHNOLOGY (PHOTOPTICS), 2017, : 114 - 121
  • [40] A new 2D method of moment basis function set for rough surfaces
    Smith, JR
    Mirotznik, MS
    7TH WORLD MULTICONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL XI, PROCEEDINGS: COMMUNICATION, NETWORK AND CONTROL SYSTEMS, TECHNOLOGIES AND APPLICATIONS: II, 2003, : 16 - 19
12345