A METHOD OF DIRECT MEASUREMENT OF THE 2D PLASMA CONDUCTIVITY TENSOR COMPONENTS NEAR SEMICONDUCTOR SURFACES

被引：0
|
作者：
DOBROVOLSKII, VN
KROLEVETS, AN
机构：
来源：
SURFACE SCIENCE | 1982年 / 120卷 / 01期
关键词：
D O I：
10.1016/0039-6028(82)90266-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L409 / L411
页数：3
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