A METHOD OF DIRECT MEASUREMENT OF THE 2D PLASMA CONDUCTIVITY TENSOR COMPONENTS NEAR SEMICONDUCTOR SURFACES

被引：0
|
作者：
DOBROVOLSKII, VN
KROLEVETS, AN
机构：
来源：
SURFACE SCIENCE | 1982年 / 120卷 / 01期
关键词：
D O I：
10.1016/0039-6028(82)90266-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L409 / L411
页数：3
相关论文
共 50 条
  • [1] 2D PLASMA LAYER CONDUCTIVITY TENSOR IN HIGH MAGNETIC FIELD.
    Horing, N.J.M.
    Kamen, E.
    Orman, M.
    Physica B: Physics of Condensed Matter & C: Atomic, Molecular and Plasma Physics, Optics, 1980, 105 (1-3): : 115 - 119
  • [2] Measurement of local optomechanical properties of a direct bandgap 2D semiconductor
    Benimetskiy, F. A.
    Sharov, V. A.
    Alekseev, P. A.
    Kravtsov, V.
    Agapev, K. B.
    Sinev, I. S.
    Mukhin, I. S.
    Catanzaro, A.
    Polozkov, R. G.
    Alexeev, E. M.
    Tartakovskii, A. I.
    Samusev, A. K.
    Skolnick, M. S.
    Krizhanovskii, D. N.
    Shelykh, I. A.
    Iorsh, I. V.
    APL MATERIALS, 2019, 7 (10)
  • [3] 2D PLASMA-LAYER CONDUCTIVITY TENSOR IN HIGH MAGNETIC-FIELD
    HORING, NJM
    KAMEN, E
    ORMAN, M
    PHYSICA B & C, 1981, 105 (1-3): : 115 - 119
  • [4] First Direct Measurement of Optical Phonons in 2D Plasma Crystals
    Couedel, L.
    Nosenko, V.
    Zhdanov, S. K.
    Ivlev, A. V.
    Thomas, H. M.
    Morfill, G. E.
    PHYSICAL REVIEW LETTERS, 2009, 103 (21)
  • [5] Direct measurement of the 2D gain profile in a tapered semiconductor laser (Conference Presentation)
    Leisher, Paul O.
    Swertfeger, Rebecca B.
    Beil, James A.
    Misak, Stephen M.
    Campbell, Jenna
    Thomas, Jeremy
    Renner, Daniel S.
    Mashanovitch, Milan L.
    NOVEL IN-PLANE SEMICONDUCTOR LASERS XVI, 2017, 10123
  • [6] Dielectric tensor of 2D relativistic motional plasma
    Tang, CJ
    Gong, YB
    Yang, YZ
    ACTA PHYSICA SINICA, 2004, 53 (04) : 1145 - 1149
  • [7] 2D surface temperature measurement of plasma facing components with modulated active pyrometry
    Amiel, S.
    Loarer, T.
    Pocheau, C.
    Roche, H.
    Gauthier, E.
    Aumeunier, M-H.
    Le Niliot, C.
    Rigollet, F.
    Courtois, X.
    Jouve, M.
    Balorin, C.
    Moncada, V.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (10):
  • [8] CONDUCTIVITY NEAR A MOBILITY EDGE IN 2D ELECTRONIC SYSTEMS
    GHIBAUDO, G
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (17): : 3067 - 3072
  • [9] Direct Fast-Neutron Detection by 2D Perovskite Semiconductor
    Gao, Yuting
    Wan, Pengying
    Jin, Tong
    Hu, Hao
    Liu, Linyue
    Niu, Guangda
    SMALL, 2023, 19 (40)
  • [10] Direct Imaging of Carrier Funneling in a Dielectric Engineered 2D Semiconductor
    Gauriot, Nicolas
    Ashoka, Arjun
    Lim, Juhwan
    See, Soo Teck
    Sung, Jooyoung
    Rao, Akshay
    ACS NANO, 2023, 18 (01) : 264 - 271
12345