DESIGN, FABRICATION AND TESTING OF SPIN-VALVE READ HEADS FOR HIGH-DENSITY RECORDING

被引:331
作者
TSANG, C [1 ]
FONTANA, RE [1 ]
LIN, T [1 ]
HEIM, DE [1 ]
SPERIOSU, VS [1 ]
GURNEY, BA [1 ]
MASON, ML [1 ]
机构
[1] IBM CORP,DIV STORAGE SYST,SAN JOSE,CA
关键词
D O I
10.1109/20.333909
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spin-valve sensors of the type NiFe/Cu/Co have been designed for optimal biasing behavior and successfully incorporated into a gigabit-type shielded read head configuration with a read trackwidth of 2 mu m, a read gap of 0.25 mu m, and a MR sensor height of 1 mu m. The spin-valve sensor had a structure of 100 Angstrom NiFe/25 Angstrom Cu/22 Angstrom Co/110 Angstrom FeMn, and yielded a net spin-valve coefficient of similar to 3.5% at the completion of head professing. Uniform field testing of the read heads after wafer fabrication and lapping showed quiet and stable spin-valve response with near optimal bias performance. Recording tests of the read heads at a head-disk clearance of 1.5 mu in showed linear, non-saturated signal response on a media with an areal moment as high as 1.25memu/cm(2), yielding reasonably symmetrical signals with peak-to-peak amplitudes ranging from similar to 750 mu V/mu m to as high as similar to 1000 mu V/mu m of read trackwidth. Linear density rolloffs and microtrack profiles have also been studied, and results showed behaviors closely agreeing with design targets for high density recording operations.
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收藏
页码:3801 / 3806
页数:6
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