LIFETIME OF ELECTRONS IN P-TYPE SILICON

被引:33
作者
BEMSKI, G
机构
来源
PHYSICAL REVIEW | 1955年 / 100卷 / 02期
关键词
D O I
10.1103/PhysRev.100.523
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:523 / 524
页数:2
相关论文
共 6 条
[1]  
BURTON, 1953, J PHYS CHEM-US, V57, P853
[2]   ELECTRON-HOLE RECOMBINATION IN GERMANIUM [J].
HALL, RN .
PHYSICAL REVIEW, 1952, 87 (02) :387-387
[3]   TRAPPING OF MINORITY CARRIERS IN SILICON .1. P-TYPE SILICON [J].
HORNBECK, JA ;
HAYNES, JR .
PHYSICAL REVIEW, 1955, 97 (02) :311-321
[4]   TRANSIENT RESPONSE OF A P-N JUNCTION [J].
LAX, B ;
NEUSTADTER, SF .
JOURNAL OF APPLIED PHYSICS, 1954, 25 (09) :1148-1154
[5]   STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J].
SHOCKLEY, W ;
READ, WT .
PHYSICAL REVIEW, 1952, 87 (05) :835-842
[6]  
Shockley W., 1952, PHYS TODAY, V5, P18, DOI DOI 10.1063/1.3067420