A METHOD FOR THE CALCULATION OF THE SOFT-ERROR RATE OF SUB-MU-M DYNAMIC LOGIC CMOS CIRCUITS

被引：0
作者：
JUHNKE, T
BRINGMANN, MP
KLAR, H
机构：
[1] Technische Universität Berlin, Institut für Mikroelektronik, Berlin, 10623
来源：
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | 1995年 / 11卷 / 04期
关键词：
SOFT-ERROR RATE; DYNAMIC CMOS LOGIC; FUNNELLING; SINGLE EVENT UPSET; CHARGE COLLECTION BY DIFFUSION;
D O I：
10.1002/qre.4680110409
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
As a prerequisite for predicting the soft-error rate (SER) of CMOS circuits with dynamic registers a method to calculate the SER is presented which takes into account charge collection by drift and diffusion. It has been found that besides collection due to drift, the noise charge collected by diffusion has to be considered to accurately predict the SER of dynamic CMOS circuits. Calculated results are compared to device simulations and SER measurements.
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页码：263 / 268
页数：6
相关论文
共 6 条
[1]  
GRIEP S, 1992, P ESREF, P43
[2]   ALPHA-PARTICLE-INDUCED FIELD AND ENHANCED COLLECTION OF CARRIERS [J].
HU, C .
ELECTRON DEVICE LETTERS, 1982, 3 (02) :31-34
[3]   MODELING DIFFUSION AND COLLECTION OF CHARGE FROM IONIZING-RADIATION IN SILICON DEVICES [J].
KIRKPATRICK, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (11) :1742-1753
[4]  
MAY TC, 1978, 16TH ANN P 1978 INT, P33
[5]   COMPUTER-ANALYSIS ON THE COLLECTION OF ALPHA-GENERATED CHARGE FOR REFLECTING AND ABSORBING SURFACE CONDITIONS AROUND THE COLLECTOR [J].
TERRILL, K ;
HU, C ;
NEUREUTHER, A .
SOLID-STATE ELECTRONICS, 1984, 27 (01) :45-52
[6]  
TOYABE T, 1982, IEEE T ELECTRON DEV, V29, P732, DOI 10.1109/T-ED.1982.20770
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