DETECTION LIMITS OF HIGH-TEMPERATURE SUPERCONDUCTING MATERIALS ON VARIOUS SUBSTRATES BY ENERGY DISPERSIVE-X-RAY FLUORESCENCE AND PROTON-INDUCED X-RAY-EMISSION METHODS

被引：2

作者：

LAL, M ^{[1
]}

BAJPAI, HN ^{[1
]}

JOSEPH, D ^{[1
]}

CHOUDHURY, RK ^{[1
]}

机构：

[1] BHABHA ATOM RES CTR,DIV NUCL PHYS,BOMBAY 400085,INDIA

来源：

PRAMANA-JOURNAL OF PHYSICS | 1990年 / 34卷 / 04期

关键词：

73.60; High temperature superconductivity; minimum detection limits; PIXE analysis; substrates: EDXRF analysis; thin film deposition; YBa[!sub]2[!/sub]Cu[!sub]3[!/sub]O[!sub]7[!/sub;

D O I：

10.1007/BF02845873

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Application of energy dispersive X-ray fluorescence (EDXRF) and proton induced X-ray emission (PIXE) methods has been demonstrated for determining the elemental composition of thin film superconducting materials. The results of analysis carried out by EDXRF method have been compared with those obtained by PIXE method. Thin films of YBa2Cu3O7 superconducting material were deposited on various substrates such as thin mylar sheet and thick substrates of SrTiO3, MgO and Al2O3. In thin backing the minimum detection limits obtained for Cu, Y, Ba by the PIXE method are 20 ng, 70 ng and 800 ng respectively and the corresponding values by the EDXRF method are 3000 ng, 600 ng and 1000 ng. Detection limits for samples on thick backings deteriorated to a large extent by both methods. © 1990 the Indian Academy of Sciences.

引用

页码：L377 / L381

页数：5

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