MOLECULAR-BEAM EPITAXY GROWTH OF VERTICAL CAVITY OPTICAL-DEVICES WITH INSITU CORRECTIONS

被引:38
作者
BACHER, K
PEZESHKI, B
LORD, SM
HARRIS, JS
机构
[1] Solid State Laboratories, Stanford University, Stanford
关键词
D O I
10.1063/1.107546
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate a novel approach to the molecular beam epitaxial (MBE) growth of vertical Fabry-Perot cavities with quarter-wave mirrors. At two selected points, the growth is interrupted and the reflectivity spectrum is measured without removing the wafer from the vacuum system. Corrections are then made in the growth of subsequent layers. By making measurements on the incomplete structure, separate corrections can be made to center both the mirror reflectivity and the cavity resonance at the desired wavelength. We present theoretical and experimental data demonstrating the effectiveness of the approach, and estimate the effects on device performance.
引用
收藏
页码:1387 / 1389
页数:3
相关论文
共 11 条
[1]  
BONE DJ, COMMUNICATION
[2]   RASTERED, UNIFORMLY SEPARATED WAVELENGTHS EMITTED FROM A 2-DIMENSIONAL VERTICAL-CAVITY SURFACE-EMITTING LASER ARRAY [J].
CHANGHASNAIN, CJ ;
WULLERT, JR ;
HARBISON, JP ;
FLOREZ, LT ;
STOFFEL, NG ;
MAEDA, MW .
APPLIED PHYSICS LETTERS, 1991, 58 (01) :31-33
[3]   CHARACTERIZATION OF GAAS/(GAAS)N(ALAS)M SURFACE-EMITTING LASER STRUCTURES THROUGH REFLECTIVITY AND HIGH-RESOLUTION ELECTRON-MICROSCOPY MEASUREMENTS [J].
FAIST, J ;
GANIERE, JD ;
BUFFAT, P ;
SAMPSON, S ;
REINHART, FK .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (03) :1023-1032
[4]   VERTICAL-CAVITY SURFACE-EMITTING LASERS - DESIGN, GROWTH, FABRICATION, CHARACTERIZATION [J].
JEWELL, JL ;
HARBISON, JP ;
SCHERER, A ;
LEE, YH ;
FLOREZ, LT .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1991, 27 (06) :1332-1346
[5]   TOP-SURFACE-EMITTING GAAS 4-QUANTUM-WELL LASERS EMITTING AT 0.85 MU-M [J].
LEE, YH ;
TELL, B ;
BROWNGOEBELER, K ;
JEWELL, JL ;
HOVE, JV .
ELECTRONICS LETTERS, 1990, 26 (11) :710-711
[6]  
Macleod H. A., 1986, THIN FILM OPTICAL FI, P32
[7]  
MACLEOD HA, 1986, THIN FILM OPTICAL FI, P244
[8]   OPTIMIZATION OF MODULATION RATIO AND INSERTION LOSS IN REFLECTIVE ELECTROABSORPTION MODULATORS [J].
PEZESHKI, B ;
THOMAS, D ;
HARRIS, JS .
APPLIED PHYSICS LETTERS, 1990, 57 (15) :1491-1492
[9]  
Siegman A.E., 1986, LASERS, P413
[10]   EFFECTS OF LAYER THICKNESS VARIATIONS ON VERTICAL-CAVITY SURFACE-EMITTING DBR SEMICONDUCTOR-LASERS [J].
WEBER, JP ;
MALLOY, K ;
WANG, S .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1990, 2 (03) :162-164